BS EN 62258-2-2011 半导体压模制品.交换数据格式.
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【英文标准名称】:Semiconductordieproducts.Exchangedataformats
【原文标准名称】:半导体压模制品.交换数据格式.
【标准号】:BSEN62258-2-2011
【标准状态】:现行
【国别】:英国
【发布日期】:2011-07-31
【实施或试行日期】:2011-07-31
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Assemblies;Automation;Automationsystems;Chips;Components;Connections;Data;Dataexchange;Dataformats;Datarepresentation;Delivery;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Exchange;Formats;Integratedcircuits;Lists;Materials;Mechanicaltesting;Productdata;Production;Semiconductorchips;Semiconductordevices;Semiconductors;Testing;Wafers
【摘要】:ThisPartofIEC62258specifiesthedataformatsthatmaybeusedfortheexchangeofdatawhichiscoveredbyotherpartsoftheIEC62258series,aswellasdefinitionsofallparametersusedaccordingtotheprinciplesandmethodsofIEC61360.ItintroducesaDeviceDataExchange(DDX)format,withtheprimegoaloffacilitatingthetransferofadequategeometricdatabetweendiemanufacturerandCAD/CAEuserandformalinformationmodelsthatallowdataexchangeinotherformatssuchasSTEPphysicalfileformat,inaccordancewithISO10303-21,andXML.Thedataformathasbeenkeptintentionallyflexibletopermitusagebeyondthisinitialscope.Ithasbeendevelopedtofacilitatetheproduction,supplyanduseofsemiconductordieproducts,includingbutnotlimitedto:?wafers,?singulatedbaredie,?dieandwaferswithattachedconnectionstructures,?minimallyorpartiallyencapsulateddieandwafers.ThisstandardreflectstheDDXdataformatatversion1.3.0
【中国标准分类号】:L40
【国际标准分类号】:31_080_99
【页数】:74P.;A4
【正文语种】:英语
【原文标准名称】:半导体压模制品.交换数据格式.
【标准号】:BSEN62258-2-2011
【标准状态】:现行
【国别】:英国
【发布日期】:2011-07-31
【实施或试行日期】:2011-07-31
【发布单位】:英国标准学会(GB-BSI)
【起草单位】:BSI
【标准类型】:()
【标准水平】:()
【中文主题词】:
【英文主题词】:Assemblies;Automation;Automationsystems;Chips;Components;Connections;Data;Dataexchange;Dataformats;Datarepresentation;Delivery;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Exchange;Formats;Integratedcircuits;Lists;Materials;Mechanicaltesting;Productdata;Production;Semiconductorchips;Semiconductordevices;Semiconductors;Testing;Wafers
【摘要】:ThisPartofIEC62258specifiesthedataformatsthatmaybeusedfortheexchangeofdatawhichiscoveredbyotherpartsoftheIEC62258series,aswellasdefinitionsofallparametersusedaccordingtotheprinciplesandmethodsofIEC61360.ItintroducesaDeviceDataExchange(DDX)format,withtheprimegoaloffacilitatingthetransferofadequategeometricdatabetweendiemanufacturerandCAD/CAEuserandformalinformationmodelsthatallowdataexchangeinotherformatssuchasSTEPphysicalfileformat,inaccordancewithISO10303-21,andXML.Thedataformathasbeenkeptintentionallyflexibletopermitusagebeyondthisinitialscope.Ithasbeendevelopedtofacilitatetheproduction,supplyanduseofsemiconductordieproducts,includingbutnotlimitedto:?wafers,?singulatedbaredie,?dieandwaferswithattachedconnectionstructures,?minimallyorpartiallyencapsulateddieandwafers.ThisstandardreflectstheDDXdataformatatversion1.3.0
【中国标准分类号】:L40
【国际标准分类号】:31_080_99
【页数】:74P.;A4
【正文语种】:英语
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